Microps X

Stand alone blank and minted coin inspection

Summary

Microps X is a stand-alone blank and minted coin inspection solution, scanning up to 3,000 coins per minute to an accuracy of up to 30 microns.

Concurrent inspection of both sides of the coin enables top and bottom mint alignment verification, in addition to the standard quality checks. The compact design not only saves space on the production floor, but also significantly reduces overal system system complexity.

Whilst employing precision technology and highly autonomous operation, Microps X remains both minimalistic and cost-effective.

Microps, next generation coin inspection.

Defects

Accurate detection and Rejection of the following defects:
Mint Alignment
Surface Stain
Rim defect
Surface Scratch
Hub and Die defect
Lamination Crack
Shape Irregularity
Rim defect
Eccentricity irregularity
Surface scratch
DISCOLOUR
Ring Eccentricity irregularity
Microps K
Microps D
Microps B
Microps A
Microps E
Microps F
Microps J
Microps I
Microps G
Microps H
Mint Alignment
Surface Stain
Rim defect
Surface Scratch
Hub and Die defect
Lamination Crack
Shape Irregularity
Rim defect
Eccentricity irregularity
Surface scratch
DISCOLOUR
Ring Eccentricity irregularity

specifications

features

Mint alignment verification (top and bottom side)

Compact and accessible design

High speed and precision

Automated system calibration

Pneumatic rejection system

Self cleaning cameras

Remote operation

Real-time/Archived statistics and analysis

Technical specs

100% accuracy up to 30 microns

Up to 3,000 coins per minute

Diameter (outer): 12mm - 35mm

Diameter (inner): 8mm - 30mm

Thickness: 1mm - 5mm

Compatible with all metals (steel, nickel, copper, bimetalic, silver, aluminium, etc.)

Compatible with all types (circular, ring, bimetallic, scalloped, etc.)

60 second calibration

Intuitive touchscreen HMI display

Resources

for further information on the product:
Product Brochure PDF

Product Updates

latest product News:

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