Microps Xi

In-process blank and minted coin inspection

Summary

Microps Xi is an in-process coin inspection solution for retrofit to a coin press, scanning up to 1,500 coins per minute to an accuracy of up to 50 microns.

This lightweight system maintains a high level of precision without creating a bottleneck in production, making 100% inspection achievable at an affordable cost.

Concurrent inspection of both sides of the coin enables top and bottom mint alignment verification, in addition to the standard quality checks. The compact design not uses minimal floorspace, but also significantly reduces overall system system complexity and maintenance.

Microps, the next generation of coin inspection.

specifications

features

Compact design

Mint alignment verification (top and bottom side)

High speed and high precision

Automated system calibration

Pneumatic rejection system

Self cleaning camera system

Remote operation

Real-time/Archived statistics and analysis

Technical specs

100% accuracy up to 50 microns

Up to 1,500 coins per minute

Diameter (outer): 12mm - 35mm

Diameter (inner): 8mm - 30mm

Compatible with all metals (steel, nickel, copper, bimetalic, silver, aluminium, etc.)

Compatible with all coin types (circular, ring, bimetallic, scalloped, etc.)

60 second calibration

Defects

Accurate detection and Rejection of the following defects:
Mint Alignment
Surface Stain
Rim defect
Surface Scratch
Hub and Die defect
Lamination Crack
Shape Irregularity
Rim defect
Eccentricity irregularity
Surface scratch
DISCOLOUR
Ring Eccentricity irregularity
No items found.
Mint Alignment
Surface Stain
Rim defect
Surface Scratch
Hub and Die defect
Lamination Crack
Shape Irregularity
Rim defect
Eccentricity irregularity
Surface scratch
DISCOLOUR
Ring Eccentricity irregularity

Resources

for further information on the product:
Product Brochure PDF

Product Updates

latest product News:

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